NVE examencongres 2009

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Op 26 november jl. vond het NVE-Examencongres plaats met als hoofdthema "Fraude".  
De hoofdsprekers van deze dag hebben hun toespraken ook ter beschikking gesteld aan de leden van de NVE die deze dag verhinderd waren.

Op de website van de NVE (www.nvexamens.nl) treft u onder het kopje Downloads / Congres  de toespraken aan van de keynote speakers:



 

  • John Fremer van Caveon Test Security,
  • Rob Meijer van de Rijksuniversiteit Groningen en van
  • Annie Kempers van de Stichting Examenkamer.

 John Fremer heeft aan de deelnemers en belangstellenden volgende tekst toegevoegd:

 From: John Fremer, One of Keynote Speakers at the Combating Fraud Conference

Lorette Bosch-Padberg has kindly agreed to send to each of you a copy of the PowerPoint slides that I used for my talk.  It was a great pleasure to interact with conference participants and I once again found that the problem of dealing with cheaters and test pirates occurs wherever there is high stakes testing.  Caveon Test Security is now in its seventh year of helping testing agencies deter and detect cheating and test theft.  I would love to talk with anyone who wants to review the security issues that they encounter with someone who spends full time helping protect valuable test items and ensuring the fairness of test results.
Please send me an Email ( Dit e-mailadres is beschermd tegen spambots. U heeft Javascript nodig om het te kunnen zien. ) or give me a call (215-805-3007). If you will be visiting the New York City area of the US, I would be pleased to travel to New York to meet with you. I also anticipate being back in The Netherlands to pursue ideas for cooperation with some of the individuals that I spoke to at the conference.  If you let me know that you are interested in talking, I will try to arrange a meeting with you and any of your colleagues who would also like to be in on the discussion.

Warm regards, John


John Fremer, President
Caveon Test Security
Cell (215) 805-3007
306 Southmoor Drive
Galloway, NJ 08205


 
"Fairness and Integrity in Testing"